Surface morphologies of the TiO2-Ag composites were studied by using scanning electron microscopy (SEM, S-4300, Hitachi, Japan). The crystalline structure of composites were analyzed by X-ray diffraction (XRD) at 40 kV with Cu K, radiation (a = 1.54 A), using an automated X-ray diffractometer (D/MAX-2500/PC, Rigaku, Japan). The ultraviolet-visible diffuse reflectance spectra (UV-VIS DRS) were obtained from a UV-VIS spectrometer (UV-VIS, CARY 5000, Varian). ...
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